Korea Instrument

Kinetic Innovation,
Leading the Future

Korea Instrument

Kinetic Innovation,
Leading the Future

Probe Card for Wafer Test

Memory MEMS
Probe Card Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

Probe Card for Wafer Test

Advanced MEMS Vertical
Probe Card Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

AMB Substrate for Power Module

Advanced Hyper Reliable
Brazing Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

Our Kinetic Innovation Made
Ever Reliable Products

MEMS Vertical Probe
Life Span (Shot)

On a Mass Production

Total Solution Provider of Probe Card

"From probe pin design and simulation to probe fabrication and card assembly,
we provide total solution for front-end wafer testing needs."

Ever Reliable
Advanced Probe Card Solution

Ever Reliable
AMB Substrate for Power Module

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AMB Technology(Active Metal Brazing)

STC Technology(Sputtered Thick Coating)

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