Korea Instrument

Kinetic Innovation,
Leading the Future

Korea Instrument

Kinetic Innovation,
Leading the Future

Probe Card for Wafer Test

Memory MEMS
Probe Card Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

Probe Card for Wafer Test

Advanced MEMS Vertical
Probe Card Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

AMB Substrate for Power Module

Advanced Hyper Reliable
Brazing Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

不断创新
坚定信赖

MEMS Vertical Probe
使用寿命 (Shot)

On a Mass Production

Probe Card
综合解决方案专业企业

"从 Probe 引脚设计与仿真到 Probe 制作与卡组装,
提供前段晶圆测试所需的综合解决方案。"

始终值得信赖的
先进 Probe Card 解决方案

Ever Reliable
AMB Substrate for Power Module

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AMB Technology(Active Metal Brazing)

STC Technology(Sputtered Thick Coating)

Contact Us

为了提供最佳的解决方案和服务,
KI 始终做好准备。

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