Korea Instrument

Kinetic Innovation,
Leading the Future

Korea Instrument

Kinetic Innovation,
Leading the Future

Probe Card for Wafer Test

Memory MEMS
Probe Card Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

Probe Card for Wafer Test

Advanced MEMS Vertical
Probe Card Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

AMB Substrate for Power Module

Advanced Hyper Reliable
Brazing Solution

Korea Instrument

Kinetic Innovation,
Leading the Future

不斷創新
堅定信賴

MEMS Vertical Probe
使用壽命 (Shot)

On a Mass Production

Probe Card
綜合解決方案專業企業

"從 Probe 針腳設計與模擬到 Probe 製作與探針卡組裝,
提供前段晶圓測試所需的綜合解決方案。"

始終值得信賴的
先進 Probe Card 解決方案

Ever Reliable
AMB Substrate for Power Module

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AMB Technology(Active Metal Brazing)

STC Technology(Sputtered Thick Coating)

Contact Us

為了提供最佳的解決方案與服務,
KI 隨時做好準備。

Inquiry

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